問題詳情
29.tEllipsometry is commonly used to measure the thickness of films. Which of the following signal is
detected in ellipsometry?
(A) resonance angle
(B) reflected laser spot
(C) second-harmonic generation
(D) polarized lightt
(E) none of the above
參考答案
答案：D
統計：A:0,B:1,C:0,D:1,E:0
難度：計算中